PT  - JOURNAL ARTICLE
AU  - Legutko, Stanislaw
AU  - Krolczyk, Grzegorz
AU  - Krolczyk, Jolanta
TI  - Quality Evaluation of Surface Layer in Highly Accurate Manufacturing
DP  - 2014 Mar 1
TA  - Manufacturing Technology Journal
PG  - 50--56
VI  - 14
IP  - 1
AID - 10.21062/ujep/x.2014/a/1213-2489/MT/14/1/50
IS  - 12132489
AB  - Precise characterization of surface topography is very important in many engineering industries. This paper describes potential possibilities of using optical 3D (three dimensional) measurement methods in surface metrology. Surface integrity describes the status and attributes of the machined surface. This paper presents possibilities of using and measurements of surface integrity, namely the surface topography and the physical parameters of which are analysis of microstructure and microhardness of the surface layer.